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Volumn 128, Issue 3, 1999, Pages 250-256
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Improving the positional accuracy of the goniometer on the Philips CM series TEM
a a a a a |
Author keywords
Automated data acquisition; Goniometer precision; Instrument control; Microscopic methods
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Indexed keywords
ACCURACY;
ARTICLE;
AUTOMATION;
CALCULATION;
GONIOMETRY;
INFORMATION PROCESSING;
MODEL;
PRIORITY JOURNAL;
TRANSMISSION ELECTRON MICROSCOPY;
VALIDATION PROCESS;
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EID: 0033619898
PISSN: 10478477
EISSN: None
Source Type: Journal
DOI: 10.1006/jsbi.1999.4181 Document Type: Article |
Times cited : (20)
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References (7)
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