Implications for the thin-film densification of TiO2 from carboxylic acid-modified titanium alkoxides. Syntheses, characterizations, and X-ray structures of various carboxylic acid modified titanium alkoxides (see abstract)

Journal of the American Chemical Society

Volumn 121, Issue 51, 1999, Pages 12104-12112

  Boyle, Timothy J ^a   Tyner, Ryan P ^a   Alam, Todd M ^b   Scott, Brian L ^c   Ziller, Joseph W ^d   Potter Jr , B G ^b  

^a ADVANCED MATERIALS LABORATORY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBOXYLIC ACID; TITANIUM DIOXIDE;

ARTICLE; CHEMICAL MODIFICATION; CHEMICAL REACTION; CRYSTAL STRUCTURE; DENSITY; FILM; GEOMETRY; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PRISM; REACTION ANALYSIS; SOLID STATE; STEREOSPECIFICITY; STOICHIOMETRY; X RAY DIFFRACTION;

EID: 0033616149     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja992521w     Document Type: Article

References (58)

1. Boyle, T. J.; Tyner, R.; Scott, B. L.; Ziller, J. W. Abstracts of Papers, 217th National Meeting of the American Chemical Society, Anaheim, CA, Spring 1999; American Chemical Society: Washington, DC, 1999; Part 1, INOR-625.
2. Bradley, D. C.; Mehrotra, R. C.; Gaur, D. P. Metal Alkoxides; Academic Press: New York, 1978.
3. Bradley, D. C. Chem. Rev. 1989, 89, 1317.
4. Hubert-Pfalzgraf, L. G. New J. Chem. 1987, 11, 663.
5. Caulton, K. G.; Hubert-Pfalzgraf, L. G. Chem. Rev. 1990, 90, 969.
6. Chandler, C. D.; Roger, C.; Hampden-Smith, M. J. Chem. Rev. 1993, 93, 1205.
7. Boyle, T. J.; Alam, T. M.; Mechenbeir, E. R.; Scott, B.; Ziller, J. W. Abstracts of Papers, 213th National Meeting of the American Chemical Society, San Francisco, CA, Spring 1997; American Chemical Society: Washington, DC, 1999; Part 2, INOR-693.
8. Day, V. W.; Everspacher, T. A.; Klemperer, W. G.; Park, C. W. J. Am. Chem. Soc. 1993, 115, 8469.
9. Day, V. W.; Eberspacher, T. A.; Klemperer, W. G.; Park, C. W. J. Am. Chem. Sac. 1993, 115, 8469.
10. Boyle, T. J.; Bradley, D. C.; Hampden-Smith, M. J.; Patel, A.; Ziller, J. W. Inorg. Chem. 1995, 34, 5893.
11. Gautier-Luneau, I.; Mosset, A.; Galy, J. Z. Kristallogr. 1987, 180, 83.
12. Doeuff, S.; Dromzee, Y.; Sanchez, C. C. R. Acad. Sci. Paris 1989, 308, 1409.
13. Doeuff, S.; Dromzee, Y.; Taulelle, F.; Sanchez, C. Inorg. Chem. 1989, 28, 4439.
14. Laaziz, I.; Larbot, A.; Guizard, C.; Durand, J.; Cot, L.; Joffre, J. Acta Crystallogr., C (Cryst. Struct. Commun.) 1990, 46, 2332.
15. Boyle, T. J.; Alam, T. A.; Dimos, D.; Moore, G. J.; Buchheit, C. D.; Al-Shareef, H. N.; Mechenbier, E. R.; Bear, B. R. Chem. Mater. 1997, 9, 3187.
16. Boyle, T. J.; Tafoya, C. J.; Scott, B. L. Abstracts of Papers, 211th National Meeting of the American Chemical Society, New Orleans, LA, Spring 1996; American Chemical Society: Washington, DC, 1996; Part 1, INOR-62.
17. Lei, X.; Shang, M.; Fehlner, T. P. Organometallics 1997, 16, 5289.
18. Schubert, U.; Arpac, E.; Glaubitt, W.; Helmerich, A.; Chau, C. Chem. Mater. 1992, 4, 291.
19. Kickelbick, G.; Schubert, U. Eur. J. Inorg. Chem. 1998, 159.
20. Boyle, T. J.; Alam, T. M.; Tafoya, C. J.; Scott, B. L. Inorg. Chem. 1998, 37, 5588.
21. Boyle, T. J.; Dimos, D. B.; Alam, T. M.; Schwartz, R. W.; Buchheit, C. D.; Sinclair, M. B. J. Mater. Res. 1997, 12, 1022.
22. Schwartz, R. W.; Assink, R. A.; Headley, T. J. Mater. Res. Soc. Symp. Proc. 1992, 243, 245.
23. Schwartz, R. W.; Boyle, T. J.; Lockwood, S. J.; Sinclair, M. B.; Dimos, D.; Buchheit, C. D. Integr. Ferroelectr. 1995, 7, 259.
24. Valden, M.; Pak, S.; Lai, X.; Goodman, D. W. Catal. Lett. 1998, 56, 7.
25. Walton, R. M.; Liu, H.; Gland, J. L.; Schwank, J. W. Sens. Actuators B-Chem. 1997, 41, 143.
26. Li, M. W.; Chen, Y. F. Ferroelectrics 1997, 195, 149.
27. Atashbar, M. Z.; Sun, H. T.; Gong, B.; Wlodarski, W.; Lamb, R. Thin Solid Films 1998, 326, 238.
28. Atashbar, M. Z.; Wlodarski, W. J. Intell. Mater. Syst. Struct. 1997, 8, 953.
29. Negishi, N.; Takeuchi, K. Mater. Lett. 1999, 38, 150.
30. Baskaran, S.; Song, L.; Liu, J.; Chen, Y. L.; Graff, G. L. J. Am. Ceram. Soc. 1998, 81, 401.
31. Peng, D. K.; Yang, P. H.; Liu, Z. T.; Meng, G. Y. Chem. J. Chin. Univ.-Chin. 1997, 18, 499.
32. Kikuchi, Y.; Sunada, K.; Iyoda, T.; Hashimoto, K.; Fujishima, A. J. Photochem. Photobiol. 1997, 106, 51.
33. Baskaran, S.; Song, L.; Liu, J.; Chen, Y. L.; Graff, G. L. J. Am. Ceram. Soc. 1998, 81, 401.
34. Wang, X. R.; Masumoto, H.; Someno, T.; Hirai, T. J. Jpn. Inst. Metals 1998, 62, 1069.
35. Martinet, C.; Paillard, V.; Gagnaire, A.; Joseph, J. J. Non-Cryst. Solids 1997, 216, 77.
36. Leprincewant, Y.; Yuzhang, K.; Van, V. N.; Souche, D.; Rivory, J. Thin Solid Films 1997, 307, 38.
37. Campus, F.; Bonhote, P.; Gratzel, M.; Heinen, S.; Walder, L. Sol. Energy Mater. Sol. Cells 1999, 56, 281.
38. Vink, T. J.; Boonekamp, E. P.; Verbeek, R. G. F. A.; Tamminga, Y. J. Appl. Phys. 1999, 85, 1540.
39. von Rottkay, K.; Richardson, T.; Rubin, M.; Slack, J.; Kullman, L. Solid State Ionics 1998, 115, 425.
40. Kullman, L.; Azens, A.; Granqvist, C. G. J. Appl. Phys. 1997, 81, 8002.
41. Wright, D. A.; Williams, D. A. Acta Crystallogr., Sect. B 1968, 24, 1107.
42. Ibers, J. A. Nature (London) 1963, 197, 686.
43. Boyle, T. J.; Schwartz, R. W.; Doedens, R. J.; Ziller, J. W. Inorg. Chem. 1995, 34, 1110.
44. Boyle, T. J.; Alam, T. M.; Mechenbeir, E. R.; Scott, B.; Ziller, J. W. Inorg. Chem. 1997, 36, 3293.
45. Perrin, D. D.; Armarego, W. L. F. Purification of Laboratory Chemicals, 3rd ed.; Pergamon Press: New York, 1988.
46. SMART Version 4.210; Bruker Analytical X-ray Systems Inc., 6300 Enterprise Lane, Madison, WI 53719, 1997.
47. SAINT Software Users Guide, Version 4.05; Bruker Analytical X-ray Systems, 6300 Enterprise Lane, Madison, WI 53719, 1997.
48. Sheldrick, G. M. SADABS; Brucker Analytical X-ray Systems, Inc.: Madison WI, 1997.
49. XSCANS and SHELXTL PC are products of Siemens Analytical X-ray Instruments, Inc., 6300 Enterprise Lane, Madison, WI 53719. (a) SHELX-93 is a program for crystal structure refinement written by G. M. Sheldrick, University Of Göttingen, Germany, 1993. (b) SHELXTL PC Version 4.2/360; Bruker Analytical X-ray Instruments, Inc., Madison, WI 53719, 1994. (c) SHELXTL Version 5.1; Bruker Analytical X-ray Systems, 6300 Enterprise Lane, Madison, WI 53719, 1997.
50. XSCANS and SHELXTL PC are products of Siemens Analytical X-ray Instruments, Inc., 6300 Enterprise Lane, Madison, WI 53719. (a) SHELX-93 is a program for crystal structure refinement written by G. M. Sheldrick, University Of Göttingen, Germany, 1993. (b) SHELXTL PC Version 4.2/360; Bruker Analytical X-ray Instruments, Inc., Madison, WI 53719, 1994. (c) SHELXTL Version 5.1; Bruker Analytical X-ray Systems, 6300 Enterprise Lane, Madison, WI 53719, 1997.
51. XSCANS and SHELXTL PC are products of Siemens Analytical X-ray Instruments, Inc., 6300 Enterprise Lane, Madison, WI 53719. (a) SHELX-93 is a program for crystal structure refinement written by G. M. Sheldrick, University Of Göttingen, Germany, 1993. (b) SHELXTL PC Version 4.2/360; Bruker Analytical X-ray Instruments, Inc., Madison, WI 53719, 1994. (c) SHELXTL Version 5.1; Bruker Analytical X-ray Systems, 6300 Enterprise Lane, Madison, WI 53719, 1997.
52. Broach, R. W. CARESS; Argonne National Laboratory; Argonne, IL, 1978.
53. XSCANS Software Users Guide, Version 2.1; Siemens Industrial Automation, Inc.: Madison, WI, 1994
54. Sheldrick, G. M. SHELXL; Siemens Analytical X-ray Instruments, Inc.: Madison WI, 1994
55. International Tables for X-ray Crystallography; Kluwer Academic Publishers: Dordrecht, The Netherlands, 1992; Vol. C.
56. Day, V. W.; Eberspacher, T. A.; Chen, Y.; Hao, J.; Klemperer, W. G. Inorg. Chim. Acta 1995, 229, 391.
57. Clark, E. P. Analytical Ed. 1941, 820.
58. Born, M.; Wolf, E. Principles of Optics; Permagon Press: New York, 1975; p 87.