Physical and chemical characterization of atmospheric aerosols by atomic force microscopy

Analytical Chemistry

Volumn 71, Issue 2, 1999, Pages 379-383

  Lehmpuhl, David W ^a,b   Ramirez Aguilar, Kathryn A ^a   Michel, Amy E ^a   Rowlen, Kathy L ^a   Birks, John W ^a  

^a UNIVERSITY OF COLORADO   (United States)

^b Malik and Seeme Hasan School of Business   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHITE; HEXANE; INORGANIC COMPOUND; OXYGEN; OZONE; POLYSTYRENE; SILICON DIOXIDE; VOLATILE AGENT;

AEROSOL; ARTICLE; ATMOSPHERE; ATOMIC FORCE MICROSCOPY; GAS; IMAGE ANALYSIS; PARTICLE SIZE; PHYSICAL CHEMISTRY; SOOT;

EID: 0033555728     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac980849m     Document Type: Article

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