Hot-electron transport through Au/CaF2/Si(111) structure studied by ballistic electron emission spectroscopy

Journal of Applied Physics

Volumn 85, Issue 2, 1999, Pages 941-946

  Sumiya, Touru ^a   Honda, Katsuya ^a   Miura, Tadao ^a   Tanaka, Shun Ichiro ^a  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CALCIUM COMPOUNDS; ELECTRON SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACES; THRESHOLD VOLTAGE;

BALLISTIC ELECTRON EMISSION SPECTROSCOPY; HOT ELECTRON TRANSPORT; INTRALAYER; SHIRAKI METHOD;

ELECTRON TRANSPORT PROPERTIES;

EID: 0033555003     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369214     Document Type: Article

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