Comparison between the polarized fourier-transform infrared spectra of aged porous silicon and amorphous silicon dioxide films on Si (100) surface

Journal of Molecular Structure

Volumn 508, Issue 1-3, 1999, Pages 87-96

  Wang, Jianping ^a   Zou, Bingsuo ^a   El Sayed, Mostafa A ^a  

^a Parker H Petit Institute of Bioengineering and Bioscience   (United States)

Author keywords

Amorphous SiO2; LO TO splitting; Polarized FTIR; Porous silicon

Indexed keywords

SILICON; SILICON DIOXIDE;

ARTICLE; CHEMICAL STRUCTURE; FILM; FOURIER TRANSFORMATION; INFRARED RADIATION; POLARIZATION; POROSITY; STRUCTURE ANALYSIS; VIBRATION;

EID: 0033554411     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2860(99)00003-4     Document Type: Article

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