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Volumn 35, Issue 3, 1999, Pages 187-188
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Low power double edge-triggered flip-flop using one latch
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC LOSSES;
SEMICONDUCTING SILICON;
TIMING CIRCUITS;
DOUBLE EDGE-TRIGGERED (DET) FLIP FLOPS;
FLIP FLOP CIRCUITS;
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EID: 0033521780
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19990164 Document Type: Article |
Times cited : (21)
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References (5)
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