Spray technique for preparing uniform large-area PIXE calibration standards from aqueous solutions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 150, Issue 1-4, 1999, Pages 96-102

  Menzel, N ^a   Hietel, B ^a   Leirer, M ^a   Szymczak, W ^a   Wittmaack, K ^a  

^a INSTITUTE OF EPIDEMIOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSOLS; CALIBRATION; HELIUM; OPTIMIZATION; PROTONS; SOLUTIONS; SPRAYING; STANDARDS; THIN FILMS;

PARTICLE INDUCED X RAY EMISSION; PROTON ENERGY; SILICON DETECTION SYSTEM; SPRAY DEPOSITION;

X RAY SPECTROSCOPY;

EID: 0033515214     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)01091-X     Document Type: Article

References (8)

1. S.A.E. Johansson, J.L. Campbell, K.G. Malmqvist, PIXE: A Novel Technique for Elemental Analysis, John Wiley, Chichester, 1988.
2. Hietel B., Schulz F., Menzel N., Tschiersch J., Busch B., Wittmaack K. Nucl. Instr. and Meth. B. 109/110:1996;498.
3. Folkmann F., Gaarde C., Huus T., Kemp K. Nucl. Instr. and Meth. B. 116:1974;487.
4. H. Halder, N. Menzel, B. Hietel, K. Wittmaack, these Proceedings (PIXE-8), Nucl. Instr. and Meth. B 150 (1999) 90.
5. W. Szymczak, J. Wessels, Y. Kataoka, K. Wittmaack, in: G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds.), Secondary Ion Mass Spectrometry SIMS XI, John Wiley, Chichester, 1998, p. 493.
6. Kreyling W.G., Ferron G.A. J. Aerosol Sci. 14:1983;264.
7. Miranda J. Nucl. Instr. and Meth. B. 118:1996;346.
8. Ishii K., Morita S. Int. J. PIXE. 1:1990;1.