Dual-energy technique for rapid, high-sensitivity PIXE analysis of aerosol samples covering elements with atomic numbers down to Z = 13

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 109-110, Issue , 1996, Pages 498-501

  Hietel, B ^a   Schulz, F ^a   Menzel, N ^a   Tschiersch, J ^a   Busch, B ^a   Wittmaack, K ^a  

^a INSTITUTE OF EPIDEMIOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PARTICLE ACCELERATORS; PARTICLE BEAMS; SAMPLING; TRACE ELEMENTS; X RAY ANALYSIS;

ATOMIC NUMBERS; DUAL ENERGY TECHNIQUE; PARTICLE INDUCED X RAY EMISSION (PIXE);

ATMOSPHERIC AEROSOLS;

EID: 4243281817     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00958-2     Document Type: Article

References (6)

1. S.A.E. Johansson and J.L. Campbell, PIXE: A Novel Technique for Elemental Analysis (Wiley, Chichester, 1988).
2. F. Folkmann, C. Gaarde, T. Huus and K. Kemp, Nucl. Instr. and Meth. 116 (1974) 487.
3. J.F. Harrison and R.A. Eldred, Adv. X-ray Anal. 17 (1973) 560.
4. J. Tschiersch, B. Hietel and P. Schramel, J. Aerosol Sci. 20 (1989) 1181.
5. F. Schulz, Poster no. 2.13 presented at this conference, Book of Abstracts, p. 42; to be published.
6. B. Hietel, N. Menzel and K. Wittmaack, these Proceedings (7th Int. Conf. on Particle-Induced X-ray Emission and its Analytical Applications, Padua, Italy, 1995) Nucl. Instr. and Meth. B 109/110 (1996) 139.