Low energy PIXE: Advantages, drawbacks, and applications

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 118, Issue 1-4, 1996, Pages 346-351

  Miranda, Javier ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; FLUORESCENCE; IONIZATION; IONS; PROTONS; RADIATION; SPATIAL VARIABLES MEASUREMENT; THIN FILMS;

DEPTH PROFILING; LIGHT ELEMENT DETECTION; PARTICLE INDUCED X RAY EMISSION; PROTON BEAMS; THIN FILM THICKNESS MEASUREMENT;

X RAY SPECTROSCOPY;

EID: 0030565069     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01176-5     Document Type: Article

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