메뉴 건너뛰기




Volumn 148, Issue 1-4, 1999, Pages 454-458

Characterization of Mg+-implanted InP by Raman spectroscopy

Author keywords

Ion beam implantation; Lattice damage; Raman scattering

Indexed keywords

AMORPHIZATION; COMPOSITION EFFECTS; CRYSTAL LATTICES; CRYSTAL ORIENTATION; ION BEAMS; ION IMPLANTATION; IRON; MAGNESIUM; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTOR DOPING;

EID: 0033513890     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00720-4     Document Type: Article
Times cited : (6)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.