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Volumn 148, Issue 1-4, 1999, Pages 454-458
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Characterization of Mg+-implanted InP by Raman spectroscopy
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Author keywords
Ion beam implantation; Lattice damage; Raman scattering
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Indexed keywords
AMORPHIZATION;
COMPOSITION EFFECTS;
CRYSTAL LATTICES;
CRYSTAL ORIENTATION;
ION BEAMS;
ION IMPLANTATION;
IRON;
MAGNESIUM;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SEMICONDUCTOR DOPING;
LATTICE DISORDER;
SEMICONDUCTING INDIUM PHOSPHIDE;
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EID: 0033513890
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(98)00720-4 Document Type: Article |
Times cited : (6)
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References (23)
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