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Journal of Applied Physics

Volumn 82, Issue 8, 1997, Pages 3736-3739

Raman-scattering criteria for characterization of anneal-restored zinc blende single crystals: Application to Si+-implanted InP

(5) Artus L a Cusco R a Ibanez J a Martin, J M b Gonzalez Diaz G b

a INSTITUTE OF EARTH SCIENCES JAUME ALMERA (Spain)

b UNIVERSIDAD COMPLUTENSE DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001394037 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.365753 Document Type: Article

Times cited : (20)

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