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Volumn 120-121, Issue , 1999, Pages 353-357

Formation of hafnium nitride films by medium-energy ion-beam-assisted deposition

Author keywords

Hafnium nitride; Ion assisted deposition; Rutherford backscattering spectroscopy; X ray diffraction

Indexed keywords

COATING; DEPOSITION; FILM; ION PLATING;

EID: 0033509533     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(99)00463-6     Document Type: Conference Paper
Times cited : (10)

References (10)
  • 9
    • 0001809043 scopus 로고    scopus 로고
    • Joint Committee for Powder Diffraction Standards, Parl Lane, Sets: 33-0592, 40-1277, 23-1097, 24-0466, 24-0465, 06-0318, 34-0104, 43-1017, 21-0904,08-0342, 40-1173, 40-1173, 39-0520, 39-0521.
    • Joint Committee for Powder Diffraction Standards, Powder Diffraction File, International Center for Diffraction Data, Parl Lane, 1998. Sets: 33-0592, 40-1277, 23-1097, 24-0466, 24-0465, 06-0318, 34-0104, 43-1017, 21-0904,08-0342, 40-1173, 40-1173, 39-0520, 39-0521.
    • (1998) Powder Diffraction File, International Center for Diffraction Data


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.