Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy

Ultramicroscopy

Volumn 75, Issue 4, 1999, Pages 203-213

  Foeth, M ^a   Stadelmann, P ^a   Buffat, P A ^a  

^a EPFL   (Switzerland)

Author keywords

Image simulation; Miscellaneous methods; Weak beam imaging

Indexed keywords

COMPUTER SIMULATION; ELECTRON BEAMS; FERROELECTRIC MATERIALS; IMAGING TECHNIQUES; INTERFEROMETRY; LEAD COMPOUNDS; THICKNESS MEASUREMENT;

FERROELECTRIC DOMAIN WALLS; LEAD TITANATE; WEAK BEAM TRANSMISSION ELECTRON MICROSCOPY;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; QUANTITATIVE ASSAY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032920105     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00060-6     Document Type: Article

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