Effects of randomness on tunnel conductance and magnetoresistance in ferromagnetic tunnel junctions

Journal of the Physical Society of Japan

Volumn 68, Issue 5, 1999, Pages 1632-1639

  Itoh, Hiroyoshi ^a   Shibata, Akinori ^a   Kumazaki, Takao ^a   Inoue, Jun Ichiro ^a   Maekawa, Sadamichi ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

CPA; Interfacial randomness; Linear response; Magnetoresistance; Tunnel junction

Indexed keywords

EID: 0033470464     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.68.1632     Document Type: Article

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