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Volumn 6, Issue 6, 1999, Pages 1168-1173

Simple X-ray speckle-pattern correlation interferometer

Author keywords

Interferometers; Small angle scattering; Speckle pattern correlation interferometry (SPCI); X ray speckle patterns

Indexed keywords


EID: 0033465601     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049599010912     Document Type: Article
Times cited : (2)

References (15)
  • 4
    • 0003545679 scopus 로고
    • §1.5. Amsterdam: Elsevier Science Publishers
    • Cowley, J. (1975) Diffraction Physics, 2nd ed., §1.5. Amsterdam: Elsevier Science Publishers.
    • (1975) Diffraction Physics, 2nd Ed.
    • Cowley, J.1
  • 8
    • 0004224256 scopus 로고
    • New York: John Wiley & Sons
    • Goodman, J. W. (1985). Statistical Optics, p. 17. New York: John Wiley & Sons.
    • (1985) Statistical Optics , pp. 17
    • Goodman, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.