Statistical analysis of X-ray speckle at the NSLS

Journal of Synchrotron Radiation

Volumn 5, Issue 1, 1998, Pages 30-36

  Tsui, Ophelia K C ^a   Mochrie, S G J ^a   Berman, L E ^b  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Coherent X rays; X ray speckle

Indexed keywords

EID: 0032221672     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S090904959701039X     Document Type: Article

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