Influence of epilayer thickness on optical properties in GaN films grown by MOCVD

Journal of the Korean Physical Society

Volumn 34, Issue SUPPL. 3, 1999, Pages

  Jeong, M S ^a   Lee, W H ^a   Lim, K Y ^a   Suh, E K ^a   Lee, H J ^a   An, H Y ^b  

^a Chonbuk National University   (South Korea)

^b JILIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033406467     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

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