A photoelectron spectroscopy study of sub-monolayer V/TiO2(001) interfaces annealed from 300 up to 623 K

Surface Science

Volumn 380, Issue 2-3, 1997, Pages 311-323

  Robba, D ^a   Ori, D M ^a   Sangalli, P ^b   Chiarello, G ^c   Depero, L E ^d   Parmigiani, F ^e  

^a CISE SpA   (Italy)

^b UNIVERSITY OF PAVIA   (Italy)

^c UNIVERSITY OF CALABRIA   (Italy)

^d UNIVERSITY OF BRESCIA   (Italy)

^e POLITECNICO DI MILANO   (Italy)

Author keywords

Photoelectron spectroscopy; Titanium oxide; Vanadium; Visible and ultraviolet photoelectron spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; BINDING ENERGY; CRYSTAL ORIENTATION; ENERGY GAP; INTERDIFFUSION (SOLIDS); MONOLAYERS; OXIDATION; THERMAL EFFECTS; TITANIUM POWDER METALLURGY; ULTRAVIOLET SPECTROSCOPY; VANADIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (UPS);

INTERFACES (MATERIALS);

EID: 0031143014     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01585-3     Document Type: Article

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