Optical constants of Bi2Te3 and Sb2Te3 measured using spectroscopic ellipsometry

Journal of Electronic Materials

Volumn 28, Issue 10, 1999, Pages 1111-1114

  Cui, Hao ^a   Bhat, I B ^a   Venkatasubramanian, R ^b  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b RTI INTERNATIONAL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELLIPSOMETRY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING ANTIMONY COMPOUNDS; SEMICONDUCTING BISMUTH COMPOUNDS; SPECTROSCOPIC ANALYSIS;

MULTIPLE SAMPLE ANALYSIS; OPTICAL CONSTANTS;

SEMICONDUCTING FILMS;

EID: 0033355819     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-999-0247-z     Document Type: Article

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