Efficient statistical analysis methodology and its application to high-density DRAMs

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1997, Pages 678-683

  Lee, Sang Hoon ^a   Choi, Chang Hoon ^a   Kong, Jeong Taek ^a   Lee, Won Seong ^a   Yoo, Jei Hwan ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FLIP CHIP DEVICES; SEMICONDUCTOR DEVICE STRUCTURES; SILICON WAFERS; STATISTICAL METHODS;

DYNAMIC RANDOM ACCESS MEMORY (DRAM); GRADIENT METHOD (GM); MODIFIED PRINCIPAL COMPONENT ANALYSIS (MPCA);

RANDOM ACCESS STORAGE;

EID: 0031381296     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)