Ar plasma treated and Al metallised polycarbonate: a XPS, mass spectroscopy and SFM study

Applied Surface Science

Volumn 150, Issue 1, 1999, Pages 19-33

  Seidel, C ^a   Kopf, H ^a   Gotsmann, B ^a   Vieth, T ^a   Fuchs, H ^a   Reihs, K ^b  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b BAYER AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; INTERFACES (MATERIALS); MASS SPECTROMETRY; METALLIZING; OXIDATION; PLASMA ETCHING; SCANNING ELECTRON MICROSCOPY; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBOXYLIC CARBON; MASS SPECTROSCOPY; ROUGHENING EFFECT;

POLYCARBONATES;

EID: 0033341760     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00012-4     Document Type: Article

References (12)

1. Rarchev B.A., Was G.S., Booske J.H. Nucl. Instr. Meth. Phys. Res. B. 106:1995;68.
2. Vasile M.J., Bachman B.J. J. Vac. Sci. Technol. A. 7:1989;2992.
3. Seidel C., Gotsmann B., Kopf H., Reihs K., Fuchs H. Surf. Interf. Anal. 26:1998;306.
4. F.M. Petrat, D. Wolany, K. Reihs, L. Wiedmann, A. Benninghoven, Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry, (SIMS X), 1995, p. 723.
5. Massaro C., Le Q.T., Pireaux J.J. Surf. Interf. Anal. 21:1994;425.
6. G. Beamson, D. Briggs, The Scienta ESCA 300 Database, Wiley, Chichester, 1992.
7. M. Keil, C.S. Rastomjee, A. Rajygopal, H. Sotobayashi, A.M. Bradshaw, C.L.A. Lamont, D. Glador, C. Buchberger, R. Fink, E. Umbach, Appl. Surf. Sci., August 97, submitted.
8. Lemoine P., Cazzini K., McGovern I.T., Blau W.J., Bätz P., Ziegler C., Göpel W. Chem. Phys. Lett. 220:1994;177.
9. M. Keil, C.S. Rastomjee, A. Rajygopal, C.L.A. Lamont, H. Sotobayashi, A.M. Bradshaw, D. Glador, E. Umbach, Surf. Interf. Anal., in press.
10. C.D. Wagner, W.M. Riggs, L.E. Davis, J.F. Moulder, Handbook of X-ray Photoelectron Spectroscopy, Perkin-Elmer, MN, 1992.
11. D. Glador, E. Umbach, private information.
12. Albrecht T.R., Grütter P., Horne D., Rugar D. J. Appl. Phys. 69:1996;668.