Direct observation of local structure of DX center by capacitance X-ray absorption fine structure

Physica B: Condensed Matter

Volumn 273-274, Issue , 1999, Pages 774-777

  Ishii, Masashi ^a   Yoshino, Yoko ^b   Takarabe, Ken Ichi ^b   Shimomura, Osamu ^c  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b OKAYAMA UNIVERSITY OF SCIENCE   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CAPACITANCE; CRYSTAL LATTICES; RELAXATION PROCESSES; SELENIUM; X RAY SPECTROSCOPY;

ALUMINUM GALLIUM ARSENIDE; X RAY ABSORPTION FINE STRUCTURE (XAFS) ANALYSIS;

SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 0033340343     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00646-8     Document Type: Article

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