An automated single ion hit at JAERI heavy ion microbeam to observe individual radiation damage

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 158, Issue 1-4, 1999, Pages 255-259

  Kamiya, Tomihiro ^a   Sakai, Takuro ^a   Naitoh, Yutaka ^a   Hamano, Tsuyoshi ^a   Hirao, Toshio ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY IONS; ION BOMBARDMENT; PARTICLE BEAM TRACKING; PARTICLE DETECTORS; RADIATION DAMAGE;

HEAVY ION MICROBEAM SYSTEMS; NUCLEAR TRACK DETECTORS; SINGLE ION HIT SYSTEMS;

ION BEAMS;

EID: 0033335805     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00325-0     Document Type: Article

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