Extraction of material parameters in NbN multilayer technology for RSFQ circuits

Physica C: Superconductivity and its Applications

Volumn 326, Issue , 1999, Pages 133-143

  Villegier, J C ^a   Delaet, B ^a   Larrey, V ^a   Febvre, P ^b   Tao, J W ^b   Angenieux, G ^b  

^a CEA GRENOBLE   (France)

^b UNIVERSITÉ DE SAVOIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CURRENT VOLTAGE CHARACTERISTICS; LEAKAGE CURRENTS; MAGNESIA; MULTILAYERS; NIOBIUM COMPOUNDS; QUANTUM ELECTRONICS; SILICON ON INSULATOR TECHNOLOGY; SUBSTRATES; TUNNEL JUNCTIONS;

INTEGRATED RESONANT STUB; RAPID SINGLE FLUX QUANTUM (RSFQ) CIRCUITS; SUPERCONDUCTIVE MULTILAYERS;

JOSEPHSON JUNCTION DEVICES;

EID: 0033335176     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(99)00410-4     Document Type: Article

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