Scheduling semiconductor device test operations on multihead testers

IEEE Transactions on Semiconductor Manufacturing

Volumn 12, Issue 4, 1999, Pages 523-530

  Freed, Tali ^a   Leachman, Robert C ^b  

^a 12500 SW 69 Avenue ^*  (United States)

^b DEPARTMENT OF INDUSTRIAL ENGINEERING AND OPERATIONS RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; SEMICONDUCTOR DEVICE TESTING;

MULTIHEAD TESTERS;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0033331288     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.806130     Document Type: Article

References (27)

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