SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 433, Issue , 1999, Pages 581-584

Effects of hydrogen on Al/Si(111)-H Schottky interfaces

(4) Hirose, K a Saitoh, T b Hanta, A b Uda, M b

a JAPAN AEROSPACE EXPLORATION AGENCY (Japan)

b WASEDA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; ALUMINUM; ATOMIC FORCE MICROSCOPY; ATOMS; FILM GROWTH; HYDROGEN; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SURFACES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOEMISSION SPECTROSCOPY; SCHOTTKY INTERFACE; THIN FILM GROWTH;

INTERFACES (MATERIALS);

EID: 0033328477 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(99)00032-1 Document Type: Article

Times cited : (6)

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