Design and characterization of an active, EMC-dedicated testchip

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 1999, Pages 905-908

  Criel, S ^a   Bonjean, F ^a   De Smedt, R ^a   De Langhe, P ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK CONTROL; APPLICATION SPECIFIC INTEGRATED CIRCUITS; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVES; INTEGRATED CIRCUIT LAYOUT; SHIFT REGISTERS;

DEPTH ASSESSMENT; EMC MEASUREMENTS; GLOBAL CONFIGURATION; GROUND BOUNCE; ON-CHIP DECOUPLING; OUTPUT DRIVERS; OUTPUT SIGNAL; SLEW RATE CONTROL;

ELECTROMAGNETIC COMPATIBILITY; MICROPROCESSOR CHIPS;

GROUND BOUNCE REDUCTION; ON CHIP DECOUPLING; SIGNAL STAGGERING; SLEW RATE CONTROL; TESTCHIP;

EID: 0033319394     PISSN: 10774076     EISSN: 21581118     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.1999.810177     Document Type: Conference Paper

References (11)

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