Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 1998, Pages 734-738

  Criel, S ^a   Bonjean, F ^a   De Smedt, R ^a   De Moerloose, J ^a   Martens, L ^a   Olyslager, F ^a   De Zutter, D ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ELECTROMAGNETIC FIELD MEASUREMENT; INTEGRATED CIRCUIT TESTING; PRINTED CIRCUIT BOARDS;

INTERCONNECTION STRUCTURES;

ELECTROMAGNETIC COMPATIBILITY;

EID: 0032284107     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)