Deep defects in n-type high-purity germanium: Quantification of optical variants of deep level transient spectroscopy

Physica B: Condensed Matter

Volumn 273-274, Issue , 1999, Pages 584-588

  Blondeel, A ^a   Clauws, P ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL DEFECTS; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRON TRAPS;

OPTICAL DEEP LEVEL TRANSIENT SPECTROSCOPY (ODLTS); PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY (PICTS);

SEMICONDUCTING GERMANIUM;

EID: 0033313789     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00579-7     Document Type: Article

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