Optical deep level transient spectroscopy of minority carrier traps in n-type high-purity germanium

Journal of Applied Physics

Volumn 81, Issue 10, 1997, Pages 6767-6772

  Blondeel, A ^a   Clauws, P ^a   Vyncke, D ^b  

^a GHENT UNIVERSITY   (Belgium)

^b Union Miniere Research   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003251377     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365219     Document Type: Article

References (15)

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