Investigation of depth-of-interaction by pulse shape discrimination in multicrystal detectors read out by avalanche photodiodes

IEEE Transactions on Nuclear Science

Volumn 46, Issue 3 PART 2, 1999, Pages 462-467

  Saoudi, A ^a,b,c   Pepin, C M ^a   Dion, F ^a   Bentourkia, M ^a   Lecomte, R ^a   Andreaco, M ^a   Casey, M ^a   Nutt, R ^a,b   Dautet, H ^a  

^a UNIVERSITÉ DE SHERBROOKE   (Canada)

^b CTI PET Systems Inc   (United States)

^c EG and G Optoelectronics   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COINCIDENCE CIRCUITS; CRYSTALS; DISCRIMINATORS; LOGIC CIRCUITS; PHOSPHORS; PHOTODIODES; SCINTILLATION COUNTERS;

AVALANCHE PHOTODIODE; DEPTH OF INTERACTION; MULTICRYSTAL DETECTOR; PHOSWICH DETECTOR; PULSE SHAPE DISCRIMINATION;

POSITRON EMISSION TOMOGRAPHY;

EID: 0033308956     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.775563     Document Type: Article

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