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Volumn 2, Issue 12, 1999, Pages 616-618

Electrodeposition of InAs

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTRODEPOSITION; ELLIPSOMETRY; INFRARED RADIATION; LIGHT ABSORPTION; SEMICONDUCTING INDIUM COMPOUNDS; THICK FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0033284252     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1390925     Document Type: Article
Times cited : (36)

References (36)
  • 27
    • 0004263014 scopus 로고
    • S. Bedair, Editor, Elsevier, Amsterdam
    • S. Bedair, in Atomic Layer Epitaxy, S. Bedair, Editor, p. 304, Elsevier, Amsterdam (1993).
    • (1993) Atomic Layer Epitaxy , pp. 304
    • Bedair, S.1
  • 31
    • 0037997768 scopus 로고
    • card numbers 15-869, 5-642, 4-784, JCPDS International Center for Diffraction Data, Swarthmore, PA
    • Powder Diffraction File, Inorganic Phases, W. F. McClune, Editor, card numbers 15-869, 5-642, 4-784, JCPDS International Center for Diffraction Data, Swarthmore, PA (1992).
    • (1992) Powder Diffraction File, Inorganic Phases
    • McClune, W.F.1
  • 33
    • 0003624373 scopus 로고
    • Springer Verlag, New York
    • K. Seeger, in Semiconductor Physics, p. 40, Springer Verlag, New York (1982).
    • (1982) Semiconductor Physics , pp. 40
    • Seeger, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.