In-situ characterisation of precipitation in Al-Cu thin films

Materials Research Society Symposium - Proceedings

Volumn 564, Issue , 1999, Pages 471-476

  Lokker, J P ^a   Bottger, A J ^b   Janssen, G C A M ^a   Radelaar, S ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COPPER ALLOYS; DIFFERENTIAL SCANNING CALORIMETRY; ENTHALPY; MICROANALYSIS; PHASE TRANSITIONS; PRECIPITATION (CHEMICAL); SOLUBILITY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ALUMINUM COPPER FOILS; ELECTRON-PROBE MICRO-ANALYSIS;

METALLIC FILMS;

EID: 0033279030     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-564-471     Document Type: Article

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