Measurement of the lattice thermal expansion coefficients of thin metal films on substrates

Journal of Applied Physics

Volumn 83, Issue 6, 1998, Pages 3035-3038

  Kraft, O ^a,b   Nix, W D ^a  

^a Stanford University   (United States)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000811680     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367118     Document Type: Article

References (13)

1. P. A. Flinn and C. Chiang, J. Appl. Phys. 67, 2927 (1990).
2. P. R. Besser, S. Brennan, and J. C. Bravman, J. Mater. Res. 9, 13 (1994).
3. W.-M. Kuschke and E. Arzt, Appl. Phys. Lett. 64, 1097 (1994).
4. G. Cornella, S.-H. Lee, W. D. Nix, and J. C. Bravman, Appl. Phys. Lett. 68, 2949 (1997).
5. P. A. Flinn and G. A. Waychunas, J. Vac. Sci. Technol. 6, 1749 (1988).
6. P. R. Besser, Ph.D. thesis, Stanford University, 1993.
7. P. M. Sutton, Phys. Rev. B Condensed Matter 91, 816 (1953).
8. D. Gerlich and E. S. Fisher, J. Phys. Chem. Solids 30, 1197 (1969).
9. J. L. Tallon and A. Wolfenden, J. Phys. Chem. Solids 40, 831 (1979).
10. R. D. Harrison, Datenbuch Chemie, Physik (Vieweg Studium, Vieweg, 1982).
11. R. O. Simmons and R. W. Balluffi, Phys. Rev. 117, 52 (1960).
12. J. L. Murray, Int. Metall. Rev. 130, 211 (1985).
13. Y.-C. Joo, P. Müllner, S. P. Baker, and E. Arzt, Mater. Res. Soc. Symp. Proc. 473, 409 (1997).