메뉴 건너뛰기




Volumn 28, Issue 1, 1999, Pages 1-13

Development of r.f. sputtered Cu/Si multilayer coatings for X-ray mirror applications

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTROMAGNETIC WAVE REFLECTION; ELLIPSOMETRY; GLASS; METALLIC FILMS; METALLIC SUPERLATTICES; MIRRORS; MULTILAYERS; SILICON; SPUTTER DEPOSITION; SURFACE ROUGHNESS; X RAY APPARATUS;

EID: 0033276745     PISSN: 09700374     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (26)
  • 3
    • 0001848787 scopus 로고
    • ed A. Chamberod and J.H. Hillairet
    • M. Piecuch and L. Nevot, Mater. Sci. Forum, ed A. Chamberod and J.H. Hillairet, 59 & 60, 93 (1990).
    • (1990) Mater. Sci. Forum , vol.59-60 , pp. 93
    • Piecuch, M.1    Nevot, L.2
  • 14
    • 0000294541 scopus 로고
    • Academic Press, C.A.
    • K. Vedam ed. "Physics of Thin Films", Academic Press, C.A. 19, p-191(1994).
    • (1994) Physics of Thin Films , vol.19 , pp. 191
    • Vedam, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.