Design of an input lens system for a 180° deflection toroidal analyser using trajectory simulation

Journal of Electron Spectroscopy and Related Phenomena

Volumn 88-91, Issue , 1998, Pages 1021-1026

  Shiraki, S ^a   Ishii, H ^a   Owari, M ^b   Nihei, Y ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

180 deflection toroidal analyser; Aberration; Focusing property; Input lens system; Photo and Auger electron diffraction; Trajectory simulation

Indexed keywords

EID: 17644448041     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00225-9     Document Type: Article

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