Statistical substantiation of parametrization of a film model in reflectometry

Crystallography Reports

Volumn 44, Issue 2, 1999, Pages 319-323

  Konovalov, O V ^a   Samoilenko, I I ^a   Feigin, L A ^a   Shchedrin, B M ^b   Yanusova, L G ^a  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033246147     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)

1. Parratt, L.G., Phys. Rev., 1954, vol. 95, p. 359.
2. Hamley, I.W. and Pedersen, J.S., J. Appl. Crystallogr., 1994, vol. 27, p. 29.
3. Penfold, J. and Thomas, R.K., J. Phys.: Condens. Matter, 1990, vol. 2, p. 1369.
4. Als-Nielsen, J., and Möhwald, H., Handbook on Synchrotron Radiation, Ebashi, S., Koch, M., and Rubinstein, E., Eds., Amsterdam: North-Holland, 1991, vol. 4, p. 1.
5. Pershan, P.S., Faraday Discuss., 1990, vol. 89, p. 231.
6. Tidswell, I.M., Ocko, B.M., Pershan, P.S., et al., Phys. Rev. B: Condens. Matter, 1990, vol. 41, p. 1111.
7. Zhou, X.-L. and Chen, S.-H. Phys. Rep., 1995, vol. 257, p. 223.
8. Pomerantz, M. and Segmuller, A., Thin Solid Films, 1980, vol. 68, p. 33.
9. Nicklow, R.M., Pomerantz, M., and Segmuller, A., Phys. Rev. B: Condens. Matter, 1981, vol. 23, p. 1081.
10. Als-Nielsen, J., Topics in Current Physics, Berlin: Springer, 1987, vol. 43, p. 181.
11. Nevot, L. and Croce, P., Rev. Phys. Appl., 1980, vol. 15, p. 761.
12. Konovalov, O.V., Feigin, L.A., and Shchedrin, B.M., Kristallografiya, 1996, vol. 41, p. 640.
13. Konovalov, O.V., Feigin, L.A., and Shchedrin, B.M., Kristallografiya, 1996, vol. 41, p. 629.
14. Linnik, Yu.V., Metod naimen'shikh kvadratov i osnovy teorii obrabotki nablyudenii (Least Squares Method and Principles of Processing of Data Observed), Moscow: Fizmatgiz, 1962.