Statistical evaluation of the accuracy of structure parameter determination from X-ray and neutron reflectivity data

Kristallografiya

Volumn 41, Issue 4, 1996, Pages 640-643

  Konovalov, O V ^a   Feigin, L A ^a   Shchedrin, B M ^a  

^a NONE

Author keywords

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Indexed keywords

EID: 0001677274     PISSN: 00234761     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. Parratt L.G. Phys. Rev. 1954. V. 95. No 2. P. 359.
2. Pomerantz M., Segmuller A. Thin Solid Films. 1980. V. 68. P. 33.