Fabrication of natural-barrier ramp-edge Josephson junctions

Superconductor Science and Technology

Volumn 12, Issue 11, 1999, Pages 726-728

  Horibe, M ^a   Inagaki, Y ^a   Matsuda, G ^a   Hayashi, N ^a   Kawai, K ^a   Maruyama, M ^a   Fujimaki, A ^a   Hayakawa, H ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRITICAL CURRENTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRODES; ELECTRON DEVICE MANUFACTURE; ETCHING; MAGNETIC FIELD EFFECTS; PRESSURE EFFECTS; THERMAL EFFECTS; YTTRIUM BARIUM COPPER OXIDES;

ANNEALING PRESSURE; ANNEALING TEMPERATURE; CHARACTERISTIC VOLTAGE; JUNCTION PROPERTIES; NATURAL BARRIER RAMP EDGE; RAMP EDGE ANGLE;

JOSEPHSON JUNCTION DEVICES;

EID: 0033224938     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/12/11/311     Document Type: Article

References (6)

1. Horibe M, Kawai K, Fujimaki A and Hayakawa H 1998 Ramp-edge Josephson junctions using barriers of various resistivities IEICE Trans. Electron. 81 (C) 1526-31
2. 7-δ barrier Appl. Phys. Lett. 69 848-50
3. c Josephson junctions Appl. Phys. Lett. 71 2526-8
4. Satoh T, Hidaka M and Tahara S 1999 High-temperature superconducting edge-type Josephson junctions with modified interfaces IEEE Trans. Appl. Supercond. at press
5. Fujimaki A, Kawai K, Hayashi N, Horibe M, Maruyama M and Hayakawa H 1999 Preparation of ramp-edge Josephson junctions with natural barriers IEEE Trans. Appl. Supercond. at press
6. Akaike H, Oke R, Aoyama T, Fujimaki A and Hayakawa H 1999 Overdamped niobium-nitride junctions for 10 K operation IEEE Trans. Appl. Supercond. at press