메뉴 건너뛰기




Volumn 20, Issue 11, 1999, Pages 592-594

In situ-doped amorphous Si0.8C0.2 emitter bipolar transistors

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; SEMICONDUCTOR DOPING; SILICON CARBIDE;

EID: 0033221693     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.798054     Document Type: Article
Times cited : (10)

References (9)
  • 1
    • 0030163944 scopus 로고    scopus 로고
    • x emitter in a silicon heterojunction bipolar transistor with a cutoff frequency of 47 GHz
    • x emitter in a silicon heterojunction bipolar transistor with a cutoff frequency of 47 GHz," J. Electrochem. Soc., vol. 143, no. 6, pp. 1949-1955, 1996.
    • (1996) J. Electrochem. Soc. , vol.143 , Issue.6 , pp. 1949-1955
    • Kondo, M.1    Shiba, T.2    Tamaki, Y.3    Nakamura, T.4
  • 2
    • 0026926459 scopus 로고
    • Genuine widebandgap microcrystalline emitter Si-HBT enhanced current gain by suppressing homocrystallization
    • Sept.
    • K. Sasaki, T. Miyajima, Y. Kubota, and S. Furukawa, "Genuine widebandgap microcrystalline emitter Si-HBT enhanced current gain by suppressing homocrystallization," IEEE Trans. Electron Devices, vol. 39, pp. 2132-2137, Sept. 1992.
    • (1992) IEEE Trans. Electron Devices , vol.39 , pp. 2132-2137
    • Sasaki, K.1    Miyajima, T.2    Kubota, Y.3    Furukawa, S.4
  • 3
    • 0028745504 scopus 로고
    • Comparison of polysilicon and silicon-carbon emitters with enhanced emitter efficiency
    • C. H. H. Emons, R. Koster, D. Paxman and M. J. J. Theunissen, "Comparison of polysilicon and silicon-carbon emitters with enhanced emitter efficiency," BCTM, pp. 72-75, 1994.
    • (1994) BCTM , pp. 72-75
    • Emons, C.H.H.1    Koster, R.2    Paxman, D.3    Theunissen, M.J.J.4
  • 5
    • 0024884487 scopus 로고
    • Hydrogenated amorphous-silicon/crystalline-silicon heterojunctions: Properties and applications
    • Dec.
    • H. Matsuura, "Hydrogenated amorphous-silicon/crystalline-silicon heterojunctions: Properties and applications," IEEE Trans. Electron Devices, vol. 36, pp. 2908-2914, Dec. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 2908-2914
    • Matsuura, H.1
  • 6
    • 0023382801 scopus 로고
    • Superbeta polysilicon emitter transistors
    • July
    • E. Keyes and N. G. Tarr, "Superbeta polysilicon emitter transistors," IEEE Electron Device Lett., vol. EDL-8, pp. 312-314, July 1987.
    • (1987) IEEE Electron Device Lett. , vol.EDL-8 , pp. 312-314
    • Keyes, E.1    Tarr, N.G.2
  • 7
    • 0021452466 scopus 로고
    • Comparison of experimental and theoretical results on polysilicon emitter bipolar transistors
    • July
    • P. Ashburn and B. Soerowirdjo, "Comparison of experimental and theoretical results on polysilicon emitter bipolar transistors," IEEE Trans. Electron Devices, vol. ED-31, pp. 853-860, July 1984.
    • (1984) IEEE Trans. Electron Devices , vol.ED-31 , pp. 853-860
    • Ashburn, P.1    Soerowirdjo, B.2
  • 8
    • 0020275804 scopus 로고
    • The role of the interfacial layer in polysilicon emitter bipolar transistors
    • Dec.
    • A. A. Eltoukhy and D. J. Roulston, "The role of the interfacial layer in polysilicon emitter bipolar transistors," IEEE Trans. Electron Devices, vol. ED-29, pp. 1862-1869, Dec. 1982.
    • (1982) IEEE Trans. Electron Devices , vol.ED-29 , pp. 1862-1869
    • Eltoukhy, A.A.1    Roulston, D.J.2
  • 9
    • 0021406709 scopus 로고
    • Method for determining the emitter and base series resistances of bipolar transistors
    • Apr.
    • T. H. Ning and D. D. Tang, "Method for determining the emitter and base series resistances of bipolar transistors," IEEE Trans. Electron Devices, vol. ED-31, pp. 409-412, Apr. 1984.
    • (1984) IEEE Trans. Electron Devices , vol.ED-31 , pp. 409-412
    • Ning, T.H.1    Tang, D.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.