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Volumn 435, Issue 1-2, 1999, Pages 178-186
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Radiation damage studies of multi-guard ring p-type bulk diodes
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Author keywords
[No Author keywords available]
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Indexed keywords
DIODES;
ELECTRIC BREAKDOWN;
IRRADIATION;
LEAKAGE CURRENTS;
PROTONS;
RADIATION DETECTORS;
CHARGE COLLECTION EFFICIENCY;
MULTI GUARD RING P-TYPE BULK DIODES;
RADIATION DAMAGE;
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EID: 0033207836
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)00438-6 Document Type: Article |
Times cited : (12)
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References (20)
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