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Volumn 383, Issue 1, 1996, Pages 144-154

Radiation induced bulk damage in silicon detectors

Author keywords

[No Author keywords available]

Indexed keywords

PION DAMAGE MEASUREMENTS; SILICON DETECTORS;

EID: 0030380821     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00668-7     Document Type: Article
Times cited : (15)

References (12)
  • 7
    • 0030216403 scopus 로고    scopus 로고
    • Proc. 7th Europ. Symp. on semiconductor detectors
    • Schloss Elmau, Germany, May 7-10, 1995
    • H. Feick, et al., Proc. 7th Europ. Symp. on Semiconductor Detectors, Schloss Elmau, Germany, May 7-10, 1995, Nucl. Instr. and Meth. A 377 (1996) 217.
    • (1996) Nucl. Instr. and Meth. A , vol.377 , pp. 217
    • Feick, H.1
  • 11
    • 0041317789 scopus 로고    scopus 로고
    • R. Wunstorf et al., in Ref. [7]
    • R. Wunstorf et al., in Ref. [7].
  • 12
    • 0042820469 scopus 로고
    • May Brunel Preprint
    • J. Matheson et al., BRU/PH/202 May 1995, Brunel Preprint.
    • (1995) BRU/PH/202
    • Matheson, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.