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Volumn 383, Issue 1, 1996, Pages 144-154
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Radiation induced bulk damage in silicon detectors
a a b b b b b c c c c d d d d e
b
CERN
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
PION DAMAGE MEASUREMENTS;
SILICON DETECTORS;
CARRIER CONCENTRATION;
COLLIDING BEAM ACCELERATORS;
ELECTRIC CURRENT MEASUREMENT;
ELECTRIC FIELD EFFECTS;
MEASUREMENT ERRORS;
RADIATION DAMAGE;
SILICON SENSORS;
PARTICLE DETECTORS;
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EID: 0030380821
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)00668-7 Document Type: Article |
Times cited : (15)
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References (12)
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