Radiation effects on breakdown characteristics of multiguarded devices

IEEE Transactions on Nuclear Science

Volumn 44, Issue 3 PART 1, 1997, Pages 721-727

  Da Rold, M ^a,b   Paccagnella, A ^a,b   Da Re, A ^a   Verzellesi, G ^c   Bacchetta, N ^b   Wheadon, R ^d   Dalla Betta, G F ^c   Candelori, A ^a,b   Soncini, G ^c,e   Bisello, D ^a,b  

^a UNIVERSITY OF PADOVA   (Italy)

^b SEZIONE DI PADOVA   (Italy)

^c UNIVERSITY OF TRENTO   (Italy)

^d INFN SEZIONE DI PISA   (Italy)

^e IRST   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000255149     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.603740     Document Type: Article

References (12)

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