Influence of short-term annealing on the conductivity of porous silicon and the transition resistivity of an aluminum-porous silicon contact

Technical Physics Letters

Volumn 24, Issue 3, 1998, Pages 226-228

  Zimin, S P ^a   Komarov, E P ^a  

^a YAROSLAVL STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032361746     PISSN: 10637850     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1262063     Document Type: Article

References (11)

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