Gold removal in failure analysis of GaAs-based laser diodes

Microelectronics Reliability

Volumn 39, Issue 6-7, 1999, Pages 1043-1047

  Vanzi, M ^a   Bonfiglio, A ^a   Salaris, P ^a   Deplano, P ^c   Trogu, E F ^c   Serpe, A ^c   Salmini, G ^b   De Palo, R ^b  

^a UNIVERSITY OF CAGLIARI   (Italy)

^b Pirelli Labs SpA   (Italy)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

DISSOLUTION; ETCHING; FAILURE ANALYSIS; GOLD; METALLIZING; SEMICONDUCTING GALLIUM ARSENIDE; TRANSMISSION ELECTRON MICROSCOPY;

GOLD METALLIZATION; GOLD REMOVAL;

SEMICONDUCTOR LASERS;

EID: 0033145396     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00144-4     Document Type: Article

References (4)

1. F. Magistrali, G. Salmini, G. Martines and M. Vanzi: "Charge Diffusion and Reciprocity Theorems: a direct approach to EBIC of Ridge Laser Diodes". Proc.22th International Symposium for Testing and Failure Analysis ISTFA/96, Los Angeles, California, November 1996, pp233-238.
2. A. Bonfiglio, M. Vanzi, M.B. Casu, F. Magistrali, M. Maini, G. Salmini: "Interpretation of sudden failures in pump laser diodes" Proc.23rd International Symposium for Testing and Failure Analysis ISTFA/97, Santa Clara, California, October 1997, pp.189-194.
3. F. Bigoli, P. Deplano, M.L. Mercuri, M.A. Pellinghelli, G. Pintus, A. Serpe and E.F. Trogu: "A powerful new oxidation agent towards metallic gold powder", Chem.Commun, 1998, pp. 2351-2352.
4. G Meneghesso, F Magistrali, D Sala, M Vanzi, C Canali, E Zanoni: "Failure mechanisms due to metallurgical interactions in commercially available AlGaAs/GaAs and AlGaAs/InGaAs HEMT's" Microelectronics Reliability, Vol.38, N.4, pp. 497-506 April 1998