XA readout chip characteristics and CdZnTe spectral measurements

IEEE Transactions on Nuclear Science

Volumn 46, Issue 1, 1999, Pages 7-18

  Barbier, L M ^a   Birsa, F ^b   Odom, J ^c   Barthelmy, S D ^a   Gehreis, N ^b   Krizmanic, J F ^b   Palmer, D ^c   Parsons, A M ^a   Stahle, C M ^b   Tueller, J ^c  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b UNIVERSITIES SPACE RESEARCH ASSOCIATION   (United States)

^c NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

Cdznte; Strip detector asic; XA

Indexed keywords

MICROPROCESSOR CHIPS; PERFORMANCE; READOUT SYSTEMS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING ZINC COMPOUNDS; X RAY SPECTROSCOPY;

CDZNTE ARRAY; X RAY IMAGING CHIP;

SEMICONDUCTOR COUNTERS;

EID: 0033076916     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.747762     Document Type: Article

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