X-ray photoemission analysis of CS 2 treated polycrystalline Cu(In,Ga)Se 2

Applied Surface Science

Volumn 140, Issue 1-2, 1999, Pages 208-214

  Nelson, A J ^a   Gregoratti, L ^b   Chagarov, E ^b   Lonza, D ^b   Marsi, M ^b   Kiskinova, M ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b SINCROTRONE TRIESTE   (Italy)

Author keywords

Polycrystalline; Scanning electron microscopy; Thin film

Indexed keywords

CARBON DISULFIDE; PHOTOEMISSION; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; SURFACE STRUCTURE; THIN FILMS;

X RAY PHOTOEMISSION ANALYSIS;

HETEROJUNCTIONS;

EID: 0033075743     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00597-2     Document Type: Article

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