EDX spectrum modelling and multivariate analysis of sub-nanometer segregation

Micron

Volumn 30, Issue 2, 1999, Pages 159-171

  Titchmarsh, J M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Analytical electron microscopy; Energy dispersive X ray; Field emission electron source scanning transmission electron microscope; High spatial resolution; Multivariate statistical analysis; Spectrum modelling; X ray analysis

Indexed keywords

EID: 0033034681     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00020-7     Document Type: Conference Paper

References (46)

1. Aebersold J.F., Stadelman P.A., Rouviere J.L. Quantitative interpretation of HRTEM images using multivariate statistics. Ultramicroscopy. 62:1996;171-189.
2. Anderson, I.M., Bentley, J., 1997. Multivariate statistical analysis of spectrum lines and images. Microscopy and Microanalysis, vol. 3 (Suppl. 2.) Springer, New York, pp. 931-932.
3. Anthony, T.R., Solute segregation and stresses generated around growing voids in metals. In: Corbett, J.W., Ianniello, L.C. (Eds.), Proceedings of the Radiation-Induced Voids in Metal and Alloys. USAEC Symp. Series 26, Conf.710601, US Atomic Energy Commission, pp. 630-645.
4. Bambenyk W., Crasemann B., Fink R.W., Freund H-U., Mark H., Swift C.D., Price R.E., Rao P.V. X-ray fluorescent yields, Auger and Coster-Kronig transition probabilities. Rev. Mod. Phys. 44:1972;716-813.
5. Bonnet N., Hannequin P. Chemical mapping and multivariate statistical analysis (prospect). Ultramicroscopy. 28:1989;248-251.
6. Bonnet N., Simova E., Thomas X. Application of multivariate statistical analysis to time dependent spectroscopy. Microsc. Microanal. Microstruct. 2:1991;129-142.
7. Bonnet N. Multivariate statistical methods for the analysis of microscope image series. J. Microsc. 190:1998;2-18.
8. Carter, R.D., Damcott, D. L., Atzmon, M., Was, G.S., Bruemmer, S.M., Kenik, E.A., 1993. Capabilities and limitations of analytical methods used to measure radiation-induced grain boundary segregation. In: Gold, R.E., Simonen, E.P. (Eds.), Proceedings of the Sixth International Symposium on Environmental Degradation of Materials in Nuclear Power Systems - Water Reactors, Warrendale Pa, USA. TMS Monograph Series, pp. 501-510.
9. Chapman J.N., Gray C.C., Robertson B.W., Nicholson W.A.P. X-ray production in thin films by electrons with energies between 40 and 100 keV - 1; Bremsstrahlung cross-sections. X-ray Spectrom. 12:1983;153-162.
10. Disko, M.M., Orchinowski, A., 1997. Field emission TEM and STEM of ultrafine metal particles. Microscopy and Microanalysis, vol. 3, (Suppl. 2). Springer, New York, pp. 389-390.
11. Doig P., Flewitt P.E.J. Microanalysis of grain boundary segregation in embrittles Fe-3 wt.% Ni alloys using STEM (scanning transmission electron microscopy). J. Microsc. 112:1978;257-267.
12. Dumbill S., Boothby R.M., Williams T.M. Grain boundary segregation in Nimonic PE16. Mater. Sci Tech. 7:1991;385-390.
13. Frank J., Van Heel M. Correspondence analysis of aligned images of biological particles. J. Mol. Biol. 161:1982;134-137.
14. Gelsema E.S., Beckers A.L.D., Sorber C.W.J., De Bruijn W.C. Quantification procedures for electron energy-loss spectroscopy and imaging: the use of correspondence analysis for element determination. J. Microsc. 166:1992;287-296.
15. Hannequin P., Bonnet N. Application of multivariate statistical analysis to energetic image series. Optik. 81:1988;6-11.
16. Haider M., Braunshausen G., Schwan E. Correction of the spherical aberration of a 200 kV TEM by means of a hexapole-corrector. Optik. 99:1995;167-179.
17. Heinrich, K.F.J., 1987. Mass absorption coefficients for electron probe microanalysis. In: Brown, J.D., Packwood, R.H. (Eds.), Proceedings of the 11th ICXOM, University of Western Ontario, London, Canada, pp. 67-119.
18. Jbara O., Cazaux J., Trebbia P. Sodium diffusion in glasses during electron irradiation. J. Appl. Phys. 78:1995;868-875.
19. Krause M.O. Atomic radiative and radiationless yields for K and L-shells. J. Phys. Chem. Ref. Data. 8:1979;307-327.
20. Krivanek O.L., Delby N., Spence A.J., Camps R.A., Brown L.M. Aberration correction in the STEM. Rodenburg J.M. Inst. Phys. Conf. Ser. No.153. 1997;35 IoP Publishing, Bristol.
21. Lagneberg A., Van Eck J. An evaluation of K-shell fluorescence yields; observations of outer shell effects. J. Phys B. 12:1979;1331-1350.
22. Michael J.R., Williams D.B. An analytical electron microscopy study of the kinetics of the equilibrium segregation of bismuth in copper. Met. Trans. A. 15:1984;99-105.
23. Murphy S.M., Perks J.M. Analysis of phosphorus segregation in ion-irradiated nickel. J. Nucl. Mat. 171:1990;360-372.
24. Ortner S. A STEM study of the effect of precipitation on grain boundary chemistry in AISI 304 steel. Acta Metall. Mater. 39:1991;341-350.
25. Partridge A., Tatlock G.J. A comparison of Auger and STEM-EDS quantification routines used in an investigation of intergranular segregation in long-term aged nimonic PE16. Surf. Interface Analysis. 18:1992;713-723.
26. Powell C.J. Cross-sections for ionization of inner-shell electrons by electrons. Rev. Mod. Phys. A. 48:1976;33-47.
27. Press W.H., Flannery B.P., Teukolsky S.A., Vetterling W.T. Numerical Recipes: the Art of Scientific Computing. 1986;CUP, Cambridge, UK.
28. Piller R.C., Marwick A.D. The radiation-induced redistribution of silicon in nickel. J. Nucl. Mat. 71:1978;309-313.
29. Quintana C., Bonnet N. Multivariate statistical analysis applied to X-ray spectra and X-ray mapping of liver cell nuclei. Scanning Microsc. 8:1994;563-586.
30. Rehn L.E., Okamoto P.R., Potter .I., Wiedersich H. Effect of solute misfit and temperature on irradiation-induced segregation in binary Ni alloys. J. Nucl. Mat. 74:1978;242.
31. Rossouw C.J., Turner P.S., White T.J., O'Connor A.J. Statistical analysis of electron channelling microanalytical data for the determination of site occupancies of impurities. Phil. Mag. Lett. 60:1989;225-232.
32. Schofield J.H. Relativistic Hartree-Slater emission rates. At. Data Nucl. Data Tables. 14:1974;122-137.
33. Seah M.P. Briggs D., Seah M.P. Practical Surface Analysis. 1983;Wiley, New York, USA.
34. Splinter S.J., Bruley J., Smith D.A. Use of target factor analysis to decompose electron energy loss spectrum-line profiles. Etz E.S. Proceedings of the 29th Annual Conference of MAS. 1995;253 VCH, New York.
35. Titchmarsh J.M., Dumbill S., Vatter I.A. Investigation of interfacial segregation in steels using multivariate analysis of EDX spectra. Etz E.S. Proceedings of the 29th Annual Conference of MAS. 1995;259 VCH, New York.
36. Titchmarsh J.M., Dumbill S. Multivariate statistical analysis of FEG-STEM EDX spectra. J. Microsc. 184:1996;195-207.
37. Titchmarsh J.M., Dumbill S. On the measurement of radiation-induced segregation (RIS) at point defect sinks. J. Nucl. Mater. 227:1996;203-219.
38. Titchmarsh J.M., Dumbill S. Multivariate statistical analysis of STEM-EDX from radiation-induced sensitisation in stainless steel. J. Microsc. 184:1997;224-236.
39. Trebbia P., Bonnet N. EELS elemental mapping with unconventional methods: I, theoretical basis: image analysis with multivariate statistics and entropy concepts. Ultramicroscopy. 34:1990;165-178.
40. Trebbia P., Mory C. EELS elemental mapping with unconventional methods: II, applications to biological specimens. Ultramicroscopy. 34:1990;179-203.
41. Trebbia P. Maxwell's demon and data analysis. Phil. Trans. R. Soc. Lond. A. 452:1996;2697-2711.
42. Vatter I.A., Titchmarsh J.M. Measurement of grain boundary segregation by STEM-EDX analysis. Ultramicroscopy. 28:1989;236-239.
43. Van Heel M., Frank J. Use of multivariate statistics in analysing the images of biological macromolecules. Ultramicroscopy. 6:1981;187-194.
44. Vecchio K.S., Williams D.B. Experimental conditions affecting coherent bremsstrahlung in X-ray microanalysis. J. Microsc. 147:1987;15-35.
45. Williams T.M., Stoneham A.M., Harries D.R. The segregation of boron to grain boundaries in solution-treated type 316 stainless steel. Met. Sci. 10:1976;14-19.
46. Williams, D.B., Watanabe, M, D.T. Carpenter, D.T. Thin film analysis and chemical mapping in the analytical electron microscope. In: Love, G., Nicholson, W.A.P., Armigliato A. (Eds.), Mikrochim. Acta [Suppl.]. Springer, Wien, 15, pp. 49-57.