Optical microcantilever consisting of channel waveguide for scanning near-field optical microscopy controlled by atomic force

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 388-392

  Niwa, T ^a   Mitsuoka, Y ^a   Kato, K ^a   Ichihara, S ^a   Chiba, N ^a   Shin Ogi, M ^a   Nakajima, K ^a   Muramatsu, H ^a   Sakuhara, T ^a  

^a SEIKO INSTRUMENTS INC   (Japan)

Author keywords

Atomic force microscopy; Optical microcantilever; Scanning near field optical microscopy; Waveguide

Indexed keywords

NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE; OPTICAL WAVEGUIDES;

ATOMIC FORCE; ATOMIC-FORCE-MICROSCOPY; BENT CHANNELS; CHANNEL WAVEGUIDE; FORCE MODES; MICRO-CANTILEVERS; OPTICAL MICROCANTILEVER; OPTICAL-; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; TIP ANGLE;

ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; FIBER OPTICS; MECHANICS; OPTICAL RESOLUTION; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SURFACE TENSION; WAVEFORM;

EID: 0032991873     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00549.x     Document Type: Conference Paper

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