Ultrafast nonlinear sub-wavelength solid immersion spectroscopy at T = 8 K: An alternative to nonlinear scanning near-field optical microscopy

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 523-527

  Vollmer, M ^a   Giessen, Harald ^a   Stolz, W ^a   Ruhle W W ^a   Knorr, A ^c   Koch, S W ^c   Ghislain, L ^b   Elings, V ^b  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

^b Digital Instruments   (United States)

^c NONE

Author keywords

Pump probe spectroscopy; Semiconductors; Solid immersion lens; Ultrafast spectroscopy

Indexed keywords

IMAGE RESOLUTION; NANOSTRUCTURES; NONLINEAR OPTICS; OPTICAL DATA STORAGE; PROBES; SEMICONDUCTOR QUANTUM WELLS;

NONLINEAR SCANNING; PUMP PROBE MEASUREMENT; PUMP/PROBE SPECTROSCOPY; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SOLID IMMERSION; SOLID IMMERSION LENS; SPATIAL RESOLUTION; SUB-WAVELENGTH; ULTRA-FAST SPECTROSCOPIES; ULTRAFAST NONLINEAR;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

CONFERENCE PAPER; GEOMETRY; LENS; MEASUREMENT; MICROSCOPY; OPTICS; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SEMICONDUCTOR;

EID: 0032990559     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00508.x     Document Type: Conference Paper

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